| 000 | 01452nam a2200325 a 4500 | ||
|---|---|---|---|
| 001 | 1670415 | ||
| 003 | BD-KhUET | ||
| 005 | 20120723145045.0 | ||
| 008 | 120723s1998 paua b 101 0 eng | ||
| 010 | _a 98022034 | ||
| 020 | _a0803124899 | ||
| 040 |
_aDLC _cDLC _dDLC _dBD-KhUET |
||
| 082 | 0 | 0 |
_a621.38152 _221 |
| 245 | 0 | 0 |
_aRecombination lifetime measurements in silicon / _cDinesh C. Gupta, Fred R. Bacher, and William M. Hughes, editors. |
| 260 |
_aWest Conshohocken, PA : _bASTM, _cc1998. |
||
| 300 |
_a392 p. : _bill. ; _c24 cm. |
||
| 500 | _aPapers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif on June 2-3, 1997. | ||
| 500 | _a"STP 1340." | ||
| 504 | _aIncludes bibliographical references and indexes. | ||
| 650 | 0 |
_aSemiconductors _xTesting _xCongresses. _96151 |
|
| 650 | 0 |
_aService life (Engineering) _xForecasting _xCongresses. _96152 |
|
| 650 | 0 |
_aElectronic measurements _xCongresses. _96153 |
|
| 700 | 1 |
_aGupta, D. C. _q(Dinesh C.) _96154 |
|
| 700 | 1 |
_aBacher, Fred R., _d1955- _96155 |
|
| 700 | 1 |
_aHughes, William M., _d1948- _96156 |
|
| 942 |
_2ddc _cBK |
||
| 999 |
_c6487 _d6487 |
||
| 952 |
_p3010032500 _40 _eAsia foundation _00 _bKUETCL _10 _o621.38152 REC _d2004-06-15 _t1 _70 _cGEN _2ddc _gGift _yBK _aKUETCL |
||